Characterization of Stresses in the SiC Layer of TRISO Coated Nuclear Fuels Using Raman Spectroscopy and EBSD

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 16; no. S2; pp. 1616 - 1617
Main Authors Kirchhofer, R, Hansford, B, Reimanis, IE, Gorman, BP
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.07.2010
Oxford University Press
Subjects
Nuclear fuels
Physical Sciences Symposia
Raman spectroscopy
Silicon carbide
Structural and Chemical Analysis of Materials in the Nuclear Power Industry
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927610058770