Characterization of Hydrogen-Encapsulated Type-I Silicon Clathrate

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 13; no. S02; pp. 1176 - 1177
Main Authors Okamoto, NL, Neiner, D, Ramasse, QM, Condron, CL, Kauzlarich, SM, Browning, ND
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2007
Oxford University Press
Subjects
Electron microscopes
Electron Microscopy Research in an Aberration-free Environment: Applications
Hydrogen
Microscopy
United States > US
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927607071292