Correction to: A Review of Cell-Aware Test Patterns to Reduce the DPPM and Test Results from 7 nm

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Bibliographic Details
Published in	Journal of the Institution of Engineers (India) Series C Vol. 104; no. 5; p. 1139
Main Authors	Edward Alaises, Renold Sam Vethamuthu, Sathasivam, Sivanantham
Format	Journal Article
Language	English
Published	New Delhi Springer India 2023 Springer Nature B.V
Subjects	Aerospace Technology and Astronautics Correction Engineering Industrial and Production Engineering Mechanical Engineering
Online Access	Get full text

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