Crop growth monitoring using multi-temporal TerraSAR-X dual-polarimetric data

Crop growth monitoring techniques using remotely sensed data have been required for precise management of crop production. In this study, multi-temporal TerraSAR-X (including TanDEM-X) dual-polarimetric data were used for monitoring the growth of beans and beetroot. In addition to gamma naught value...

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Bibliographic Details
Published inJournal of the Japan society of photogrammetry and remote sensing Vol. 58; no. 5; pp. 255 - 259
Main Authors SUGIYAMA, Erika, SONOBE, Rei, TANI, Hiroshi, KOBAYASHI, Nobuyuki, MOCHIZUKI, Kan-ichiro
Format Journal Article
LanguageJapanese
English
Published Tokyo Japan Society of Photogrammetry and Remote Sensing 2019
Japan Science and Technology Agency
Subjects
Beans
Crop growth
Crop production
Decomposition
Parameters
Polarimetry
Polarization
Remote monitoring
Remote sensing
Superhigh frequencies
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Summary:Crop growth monitoring techniques using remotely sensed data have been required for precise management of crop production. In this study, multi-temporal TerraSAR-X (including TanDEM-X) dual-polarimetric data were used for monitoring the growth of beans and beetroot. In addition to gamma naught values, polarimetric parameters were calculated using m-chi decomposition and dual polarization entropy/alpha decomposition. The results showed that the gamma naught of VV polarization and two polarimetric parameters of the m-chi decomposition (single-or odd-bounce (Odd) and randomly oriented (Rnd) scattering) from X-band SAR data possess potential for monitoring crop growth.
ISSN:0285-5844
1883-9061
DOI:10.4287/jsprs.58.255