A fast two-dimensional measurement system of birefringence dispersion for LCD retardation film

A fast two-dimensional measurement system of birefringence dispersion is developed for inspection of LCD retardation film. An optical arrangement of this system consists of a polarizer, a carrier retarder and an analyzer. The carrier retarder can be introduced a carrier frequency into an intensity d...

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Published inJournal of the Japan Society for Precision Engineering, Contributed Papers Vol. 72; no. 5; pp. 602 - 606
Main Authors WAKAYAMA, Toshitaka, KUROKAWA, Takashi, OTANI, Yukitoshi, UMEDA, Norihiro
Format Journal Article
LanguageEnglish
Published Tokyo The Japan Society for Precision Engineering 05.05.2006
Japan Science and Technology Agency
Subjects
birefringence dispersion measurement
in line measurement
line type of imaging spectrometer
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ISSN1348-8724
1881-8722
DOI10.2493/jspe.72.602

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Abstract A fast two-dimensional measurement system of birefringence dispersion is developed for inspection of LCD retardation film. An optical arrangement of this system consists of a polarizer, a carrier retarder and an analyzer. The carrier retarder can be introduced a carrier frequency into an intensity distribution along wave number. A Xenon flash lamp is employed as a white light source and synchronized with the line type of imaging spectrometer. The detected intensity distribution changes the sinusoidal wave along wave number. A phase distribution is calculated by Fourier transform method. The retardation distribution of a polymer sample is analyzed to subtract phase distributions with and without the sample. In the experiments, the some polymer films are measured as demonstrations and evaluated to the non-uniformity of retardation distribution.
AbstractList A fast two-dimensional measurement system of birefringence dispersion is developed for inspection of LCD retardation film. An optical arrangement of this system consists of a polarizer, a carrier retarder and an analyzer. The carrier retarder can be introduced a carrier frequency into an intensity distribution along wave number. A Xenon flash lamp is employed as a white light source and synchronized with the line type of imaging spectrometer. The detected intensity distribution changes the sinusoidal wave along wave number. A phase distribution is calculated by Fourier transform method. The retardation distribution of a polymer sample is analyzed to subtract phase distributions with and without the sample. In the experiments, the some polymer films are measured as demonstrations and evaluated to the non-uniformity of retardation distribution.
Author OTANI, Yukitoshi
KUROKAWA, Takashi
UMEDA, Norihiro
WAKAYAMA, Toshitaka
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Cites_doi 10.1117/12.618065
10.1364/OL.24.001475
10.1016/0921-5956(90)80019-R
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References 7) 若山 俊隆，高和 宏行，大谷 幸利，梅田 倫弘，吉澤 徹：波長依存性を考慮した複屈折分布計測，光学，31, 11(2002)826.
11) M. Takeda : “Spatial-carrier fringe-pattern analysis and its applications to precision interferometry and profilometry: An overview,” Industrial Metrology, 1 (1990), 79-99.
3) M. Lu, K.H. Yang, A.E. Rosenbluth and T. Nakasogi : Twisted-Film Compensated Twist Nematic and Double Twist Nematic Modes for Achromatic Reflective Displays, Jpn. J. Appl. Phys. 39(2000)1762.
8) K. Oka, T.Kato : Spectroscopic polarimetry with a channeled spectrum, Opt. Lett. 24 (1999), 1475.
9) 岡 和彦, 唐沢 直樹，柴田 征人，勝呂 彰，森田 隆二，山下 幹雄：スペクトル領域干渉法を利用した液晶空間光変調器の分散測定, 応用物理学会春季講演会 28p-P3-2 (2000),1001.
2) 野崎 昭俊：光ディスク用レンズの複屈折評価，精密工学会誌, 70, 5 (2004) 610.
5) T. Wakayama, Y. Otani, N. Umeda, T. Yoshizawa : Birefringence dispersion measurement by geometric phase, Proc.SPIE 4902, (2002)406.
6) B. Wang : Linear birefringence measurement instrument using two photoelastic modulators, Opt.Eng. 41,5, 981 (2002).
10) T. Wakayama, Y. Otani, N. Umeda : Real-time measurement for birefringence dispersion using double retarder, Proc. of SPIE 5888 (2005) ,55-60.
1) 大谷 幸利：液晶用デバイスと製造評価，精密工学会誌, 70, 5 (2004) 598.
4) R.M.A. Azzam, N.M. Bashara : ” Ellipsometry and polarized light ”, North-Holland personal library, (1986).
11
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2
3
4
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OKA K (8) 1999; 24
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References_xml – reference: 2) 野崎 昭俊：光ディスク用レンズの複屈折評価，精密工学会誌, 70, 5 (2004) 610.
– reference: 1) 大谷 幸利：液晶用デバイスと製造評価，精密工学会誌, 70, 5 (2004) 598.
– reference: 8) K. Oka, T.Kato : Spectroscopic polarimetry with a channeled spectrum, Opt. Lett. 24 (1999), 1475.
– reference: 9) 岡 和彦, 唐沢 直樹，柴田 征人，勝呂 彰，森田 隆二，山下 幹雄：スペクトル領域干渉法を利用した液晶空間光変調器の分散測定, 応用物理学会春季講演会 28p-P3-2 (2000),1001.
– reference: 10) T. Wakayama, Y. Otani, N. Umeda : Real-time measurement for birefringence dispersion using double retarder, Proc. of SPIE 5888 (2005) ,55-60.
– reference: 7) 若山 俊隆，高和 宏行，大谷 幸利，梅田 倫弘，吉澤 徹：波長依存性を考慮した複屈折分布計測，光学，31, 11(2002)826.
– reference: 6) B. Wang : Linear birefringence measurement instrument using two photoelastic modulators, Opt.Eng. 41,5, 981 (2002).
– reference: 3) M. Lu, K.H. Yang, A.E. Rosenbluth and T. Nakasogi : Twisted-Film Compensated Twist Nematic and Double Twist Nematic Modes for Achromatic Reflective Displays, Jpn. J. Appl. Phys. 39(2000)1762.
– reference: 5) T. Wakayama, Y. Otani, N. Umeda, T. Yoshizawa : Birefringence dispersion measurement by geometric phase, Proc.SPIE 4902, (2002)406.
– reference: 11) M. Takeda : “Spatial-carrier fringe-pattern analysis and its applications to precision interferometry and profilometry: An overview,” Industrial Metrology, 1 (1990), 79-99.
– reference: 4) R.M.A. Azzam, N.M. Bashara : ” Ellipsometry and polarized light ”, North-Holland personal library, (1986).
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SubjectTerms birefringence dispersion measurement
in line measurement
line type of imaging spectrometer
Title A fast two-dimensional measurement system of birefringence dispersion for LCD retardation film
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