A fast two-dimensional measurement system of birefringence dispersion for LCD retardation film

• Published in: Journal of the Japan Society for Precision Engineering, Contributed Papers Vol. 72; no. 5; pp. 602 - 606
• Main Authors: WAKAYAMA, Toshitaka, KUROKAWA, Takashi, OTANI, Yukitoshi, UMEDA, Norihiro
• Format: Journal Article
• Language: English
• Published: Tokyo The Japan Society for Precision Engineering 05.05.2006; Japan Science and Technology Agency
• Subjects: birefringence dispersion measurement; in line measurement; line type of imaging spectrometer
• ISSN: 1348-8724; 1881-8722
• DOI: 10.2493/jspe.72.602

A fast two-dimensional measurement system of birefringence dispersion is developed for inspection of LCD retardation film. An optical arrangement of this system consists of a polarizer, a carrier retarder and an analyzer. The carrier retarder can be introduced a carrier frequency into an intensity distribution along wave number. A Xenon flash lamp is employed as a white light source and synchronized with the line type of imaging spectrometer. The detected intensity distribution changes the sinusoidal wave along wave number. A phase distribution is calculated by Fourier transform method. The retardation distribution of a polymer sample is analyzed to subtract phase distributions with and without the sample. In the experiments, the some polymer films are measured as demonstrations and evaluated to the non-uniformity of retardation distribution.