Finding Optimal Imaging Parameters for Measuring Long-Range Electric Fields with 4DSTEM by Utilizing STEM Multislice Simulations

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 28; no. S1; pp. 440 - 441
Main Authors Heimes, Damien, Beyer, Andreas, Ahmed, Shamail, Chejarla, Varun, Volz, Kerstin
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2022
Oxford University Press
Subjects
Analytical Sciences Symposia
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Electric fields
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927622002458