Performance Characterization of Hitachi HD-2300A STEM with Dual-EDS Configuration

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 16; no. S2; pp. 942 - 943
Main Authors Myers, BD, McIlwrath, K, Wu, J, Li, S, Inada, H, Dravid, VP
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.07.2010
Oxford University Press
Subjects
Compositional X-ray Imaging
Instrumentation and Techniques Symposia
Microscopy
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927610057636