Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations

• Published in: Microscopy and microanalysis Vol. 25; no. S2; pp. 1892 - 1893
• Main Authors: Zhang, Ruopeng, Zhao, Shiteng, Pekin, Thomas, Rothchild, Eric, Asta, Mark, Chrzan, Daryl. C., Minor, Andrew M.
• Format: Journal Article
• Language: English
• Published: New York, USA Cambridge University Press 01.08.2019; Oxford University Press
• Subjects: Electron diffraction; First principles; In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies; Physical Science Symposia