Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 25; no. S2; pp. 1892 - 1893
Main Authors Zhang, Ruopeng, Zhao, Shiteng, Pekin, Thomas, Rothchild, Eric, Asta, Mark, Chrzan, Daryl. C., Minor, Andrew M.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2019
Oxford University Press
Subjects
Electron diffraction
First principles
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Physical Science Symposia
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927619010195