Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations

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Published inMicroscopy and microanalysis Vol. 25; no. S2; pp. 1892 - 1893
Main Authors Zhang, Ruopeng, Zhao, Shiteng, Pekin, Thomas, Rothchild, Eric, Asta, Mark, Chrzan, Daryl. C., Minor, Andrew M.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2019
Oxford University Press
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Author Zhao, Shiteng
Asta, Mark
Pekin, Thomas
Zhang, Ruopeng
Minor, Andrew M.
Rothchild, Eric
Chrzan, Daryl. C.
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  organization: 1Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA
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  organization: 1Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA
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Cites_doi 10.1017/S143192761800154X
10.1016/j.actamat.2015.09.048
10.1007/s11661-002-0139-9
10.1016/j.scriptamat.2017.11.005
10.1080/01418610208243202
10.1007/BF02644528
10.1016/0036-9748(73)90104-X
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References S1431927619010195_ref6
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Blackburn (S1431927619010195_ref1) 1969; 62
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  doi: 10.1017/S143192761800154X
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  doi: 10.1016/j.actamat.2015.09.048
– ident: S1431927619010195_ref9
  doi: 10.1007/s11661-002-0139-9
– volume: 62
  start-page: 398
  year: 1969
  ident: S1431927619010195_ref1
  publication-title: Trans. ASM
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  doi: 10.1016/j.scriptamat.2017.11.005
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  doi: 10.1080/01418610208243202
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  doi: 10.1080/01418610208243202
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StartPage 1892
SubjectTerms Electron diffraction
First principles
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Physical Science Symposia
Title Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations
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