Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations
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Published in | Microscopy and microanalysis Vol. 25; no. S2; pp. 1892 - 1893 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York, USA
Cambridge University Press
01.08.2019
Oxford University Press |
Subjects | |
Online Access | Get full text |
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Author | Zhao, Shiteng Asta, Mark Pekin, Thomas Zhang, Ruopeng Minor, Andrew M. Rothchild, Eric Chrzan, Daryl. C. |
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Author_xml | – sequence: 1 givenname: Ruopeng surname: Zhang fullname: Zhang, Ruopeng organization: 1Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA – sequence: 2 givenname: Shiteng surname: Zhao fullname: Zhao, Shiteng organization: 1Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA – sequence: 3 givenname: Thomas surname: Pekin fullname: Pekin, Thomas organization: 3Department of Physics, Humboldt-Universität zu Berlin, Newtonstraße 15, 12489 Berlin, Germany – sequence: 4 givenname: Eric surname: Rothchild fullname: Rothchild, Eric organization: 1Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA – sequence: 5 givenname: Mark surname: Asta fullname: Asta, Mark organization: 1Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA – sequence: 6 givenname: Daryl. C. surname: Chrzan fullname: Chrzan, Daryl. C. organization: 1Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA – sequence: 7 givenname: Andrew M. surname: Minor fullname: Minor, Andrew M. email: aminor@berkeley.edu organization: 1Department of Materials Science and Engineering, University of California, Berkeley, Berkeley 94720, USA |
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References | S1431927619010195_ref6 S1431927619010195_ref7 S1431927619010195_ref10 S1431927619010195_ref8 S1431927619010195_ref9 Blackburn (S1431927619010195_ref1) 1969; 62 S1431927619010195_ref2 S1431927619010195_ref3 S1431927619010195_ref4 S1431927619010195_ref5 |
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SubjectTerms | Electron diffraction First principles In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies Physical Science Symposia |
Title | Understanding the Slip Planarity and Residual Strain Field in Ti-6Al using Nanobeam Electron Diffraction and First Principles Calculations |
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