Expanding the Limits of Atom Probe Crystallographic Analysis

• Published in: Microscopy and microanalysis Vol. 28; no. S1; pp. 756 - 758
• Main Authors: Breen, Andrew J., Day, Alec C., Theska, Felix, Lim, Bryan, Davids, William, Primig, Sophie, Ringer, Simon P.
• Format: Journal Article
• Language: English
• Published: New York, USA Cambridge University Press 01.08.2022; Oxford University Press
• Subjects: Analytical Sciences Symposia; Calibration; Crystallography; Datasets; Engineering; Microscopy; On Demand - Expanding the Limits of Atom Probe Tomography; Sensors