Expanding the Limits of Atom Probe Crystallographic Analysis

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 28; no. S1; pp. 756 - 758
Main Authors Breen, Andrew J., Day, Alec C., Theska, Felix, Lim, Bryan, Davids, William, Primig, Sophie, Ringer, Simon P.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2022
Oxford University Press
Subjects
Analytical Sciences Symposia
Calibration
Crystallography
Datasets
Engineering
Microscopy
On Demand - Expanding the Limits of Atom Probe Tomography
Sensors
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927622003464