Characterization of Small Cu Grains Using the Conical Dark-Field Technique in the Transmission Electron Microscope

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Bibliographic Details
Published in	Microscopy and microanalysis Vol. 17; no. S2; pp. 1100 - 1101
Main Authors	Hūbner, R, Engelmann, H-J, Zschech, E
Format	Journal Article
Language	English
Published	New York, USA Cambridge University Press 01.07.2011 Oxford University Press
Subjects	Advances in Electron Crystallography for Materials Research Instrumentation and Techniques
Online Access	Get full text

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Summary:	Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
ISSN:	1431-9276 1435-8115
DOI:	10.1017/S1431927611006374