Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT): Powerful Synergetic Techniques for Materials Scientists

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 26; no. S2; pp. 524 - 525
Main Authors Francois-Saint-Cyr, Hugues, Martin, Isabelle, Peres, Paula, Guillermier, Christelle, Prosa, Ty, Blanc, Wilfried, Larson, David
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2020
Oxford University Press
Subjects
Mass spectrometry
Mass spectroscopy
Secondary ion mass spectrometry
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Applications of Secondary Ion Mass Spectrometry to Organic and Material Systems
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927620014944