Noise Removal by Crystallographic Averaging and Information Content of an Image With Respect to Detections of Plane Symmetries

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 22; no. S3; pp. 562 - 563
Main Authors Moeck, Peter, Dempsey, Andrew, Straton, Jack C.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.07.2016
Oxford University Press
Subjects
Advances in Image Processing, Display and Analysis
Analytical and Instrumentation Science Symposia
Crystallography
Electrons
Microscopy
Signal to noise ratio
Symmetry
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927616003664