Progress in Crystallographic Image Processing for Scanning Probe Microscopy

Saved in:
Bibliographic Details
Published inMicroscopy and microanalysis Vol. 21; no. S3; pp. 1611 - 1612
Main Authors Moeck, Peter, Straton, Jack
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2015
Oxford University Press
Subjects
A07 Scanning Probe Microscopy: New Methods and Applications
Analytical and Instrumentation Science Symposia
Arrays
Crystallography
Electron microscopes
Microscopy
Open access
Symmetry
Online AccessGet full text

Cover

More Information
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927615008831