Infrared Pump-Probe Spectroscopy of Plasmons in Graphene and Semiconductors

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 21; no. S3; pp. 1415 - 1416
Main Authors Wagner, M., Fei, Z., McLeod, A. S., Maddox, S. J., Rodin, A. S., Bao, W., Iwinski, E. G., Zhao, Z., Goldflam, M., Liu, M., Dominguez, G., Thiemens, M., Fogler, M. M., Castro-Neto, A. H., Lau, C. N., Amarie, S., Keilmann, F., Bank, S. R., Averitt, R. D., Basov, D. N.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2015
Oxford University Press
Subjects
A05 Fast and Ultrafast Imaging with Electrons and Photons
Analytical and Instrumentation Science Symposia
Graphene
Lasers
Microscopy
Physics
Semiconductors
La Jolla California
California
United States > US
Germany
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927615007850