Effect of vacuum annealing on structural, electrical and thermal properties of e-beam evaporated Bi 2 Te 3 thin films

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Bibliographic Details
Published inThin solid films Vol. 629; pp. 28 - 38
Main Authors Sudarshan, C., Jayakumar, S., Vaideki, K., Sudakar, C.
Format Journal Article
LanguageEnglish
Published 01.05.2017
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ISSN:0040-6090
DOI:10.1016/j.tsf.2017.03.043