Structural dependence of CsI(Tl) film scintillation properties
Scintillating CsI(Tl) films were obtained by vacuum deposition on single crystalline LiF substrates and non-orienting glass substrates. Their structure and morphology were examined by X-ray diffraction and scanning electron microscopy. Scintillation properties of films dependent on their structure a...
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| Published in | Semiconductor physics, quantum electronics, and optoelectronics Vol. 7; no. 3; pp. 297 - 300 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
21.10.2004
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| Online Access | Get full text |
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| Summary: | Scintillating CsI(Tl) films were obtained by vacuum deposition on single crystalline LiF substrates and non-orienting glass substrates. Their structure and morphology were examined by X-ray diffraction and scanning electron microscopy. Scintillation properties of films dependent on their structure are discussed. |
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| Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
| ISSN: | 1560-8034 1605-6582 |
| DOI: | 10.15407/spqeo7.03.297 |