Optimization on Conventional Photolithography Process of 0.98 μm Gap Design for Micro Gap Biosensor Application

. Pattern design transfer is the most crucial step in fabrication. Even a small mistake in fabrication can result in device damage or poor performance. To ensure the device performs perfectly, exact design and dimension pattern should be perfectly transferred onto wafer substrate. In this paper, opt...

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Published inApplied mechanics and materials Vol. 754-755; no. Advanced Materials Engineering and Technology III; pp. 524 - 529
Main Authors Nurfaiz, M., Md Arshad, Mohd Khairuddin, Fathil, M.F.M., Azman, A.H., Ramzan, Mat Ayub, Hashim, Uda, Zaki, M.
Format Journal Article
LanguageEnglish
Published Trans Tech Publications Ltd 20.04.2015
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Summary:. Pattern design transfer is the most crucial step in fabrication. Even a small mistake in fabrication can result in device damage or poor performance. To ensure the device performs perfectly, exact design and dimension pattern should be perfectly transferred onto wafer substrate. In this paper, optimization of conventional photolithography process of 0.98μm gap design for micro gap biosensor application is presented. The micro gap pattern on chrome mask is used and the effect of coating profile, UV light, and Post Exposure Bake (PEB) process are investigated. The conventional photolithography process (using a micro gap mask) starts after the silicon oxide, polysilicon and aluminium have been deposited on top of the substrate. Each set of experiment conducted by pairing the element investigated coating profile, UV light, and PEB, with the normal specification of photolithography process. It was observed that 0.98μm gap size can be achieved by choosing suitable process parameters i.e. thickness of coating profile, time and temperature used for UV light and PEB.
Bibliography:Selected, peer reviewed papers from the 3rd International Conference on Advanced Material Engineering & Technology (ICAMET 2014), December 4-5, 2014, Ho Chi Minh City, Vietnam
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ISSN:1660-9336
1662-7482
1662-7482
DOI:10.4028/www.scientific.net/AMM.754-755.524