Admittance Measurement for a Quantum Point Contact in a Multiterminal Quantum Hall Device

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 50; no. 4S; p. 4
Main Authors Washio, Kazuhisa, Hashisaka, Masayuki, Kamata, Hiroshi, Muraki, Koji, Fujisawa, Toshimasa
Format Journal Article
LanguageEnglish
Published 01.04.2011
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ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.50.04DJ04