Electrical Extractions of One Dimensional Doping Profile and Effective Mobility for Metal–Oxide–Semiconductor Field-Effect Transistors

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 50; no. 1S1; p. 1
Main Authors Park, Hyunho, Lee, Kong-soo, Baek, Dohuyn, Kang, Juseong, So, Byungse, Kwon, Seok Il, Choi, Byoungdeok
Format Journal Article
LanguageEnglish
Published 01.01.2011
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ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.50.01AA01