Electrothermal Transient Co-Simulation With Domain Decomposition Method for 3-D Complex Integrated Systems

• Published in: IEEE transactions on components, packaging, and manufacturing technology (2011) Vol. 14; no. 8; pp. 1374 - 1383
• Main Authors: Wu, Qiuyue, Xu, Yuan, Liu, Na, Zhuang, Mingwei, Huo Liu, Qing
• Format: Journal Article
• Language: English
• Published: IEEE 01.08.2024
• Subjects: Couplings; Domain decomposition method (DDM); Electric potential; electrothermal co-simulation; Finite element analysis; Heating systems; Mathematical models; multiscale electron devices; Temperature distribution; Transient analysis
• ISSN: 2156-3950; 2156-3985
• DOI: 10.1109/TCPMT.2024.3428478

In the field of modern electronics engineering, the analysis of electrothermal coupling in multiscale electronic devices is increasingly complex, demanding more computational resources and presenting challenges in rapid convergence. This complexity is further heightened by the continuous evolution of integrated circuit (IC) packaging technologies. Recognizing these challenges, this study introduces a new domain decomposition method (DDM) specifically engineered to address transient electrothermal coupling analysis in such environments. The proposed DDM can utilize meshes with varying densities across different subdomains and employ nonconformal meshes at the interface. This method can optimize computational efficiency while ensuring simulation accuracy. The contribution lies in its ability to flexibly mesh the structure according to its characteristics and reduce the overall degrees of freedom (DoFs). Representative examples are used for a series of tests in modern ICs. The results demonstrate not only the accuracy but also the efficiency in handling intricate electrothermal coupling problems. In the context of escalating multiscale integration complexities, the proposed DDM provides a powerful tool for engineers and designers to optimize device performance.