Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope

Saved in:
Bibliographic Details
Published inMicroscopy and microanalysis Vol. 29; no. Supplement_1; pp. 416 - 417
Main Authors Watanabe, Masashi, Guzzinati, Giulio, Kükelhan, Pirmin, Gerheim, Volker, Linck, Martin, Müller, Heiko, Haider, Max, Hoffman, Thomas F, Isabell, Thomas, Shimura, Naoki, Sawada, Hidetaka
Format Journal Article
LanguageEnglish
Published 22.07.2023
Online AccessGet full text

Cover

More Information
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1431-9276
1435-8115
DOI:10.1093/micmic/ozad067.196