TRUSTWORTHY OF INTEGRATED CIRCUITS: CHARACTERISTICS AND REASONS FOR THEIR VIOLATION

• Published in: Bezopasnostʹ informat͡s︡ionnykh tekhnologiĭ Vol. 32; no. 2; pp. 178 - 191
• Main Author: Mosin, Sergey G.
• Format: Journal Article
• Language: English
• Published: Joint Stock Company "Experimental Scientific and Production Association SPELS 01.05.2025
• Subjects: trustworthy of integrated circuits, resilience, reliability, safety, security, systematic faults, random faults, intentional faults
• ISSN: 2074-7128; 2074-7136
• DOI: 10.26583/bit.2025.2.13

TThe main technologies of the fourth industrial revolution (Industry 4.0) are actively implemented in various sectors of the economy with the formation of critical infrastructure (CI) platforms. The development of hardware for CI objects requires the use of trustworthy integrated circuits (IC). A significant increase in the functional and structural complexity of modern IC, as well as the disruption of IC supply chains due to the geopolitical situation and/or unfair competition lead to a problem – violation of the trustworthiness of the IC. Systematization of faults and the reasons for their occurrence is the basis for development both models and methods responsible for choosing the appropriate countermeasures to ensure the trustworthiness of the IC at all stages of the life cycle. The object of the presented study is integrated circuits as the basis of the CI hardware. The subject of the study is faults and the reasons for their occurrence at different stages of the design and manufacturing phases that affect the trustworthiness of the IC. The scope of the proposed work is to determine the possible causes of violation of the trustworthiness of the IC (TwIC) that occur at the design and production phases, classify faults and the degree of their impact on the characteristics of the TwIC. The decomposition of the TwIC characteristics into key and supporting ones has been performed. A mapping of systematic, random and intentional faults onto the TwIC characteristics has been proposed. The causes of violation of the TwIC key characteristics have been determined.