SEUs Induced by Thermal to High-Energy Neutrons in SRAMs

We report on experimental SEU studies using thermal and high-energy neutrons, conducted at the TRIUMF facility, Vancouver. Different SRAM samples were used and many samples showed to be highly susceptible to thermal neutrons. Moreover, a considerable part of the total SEU-rate, at high altitudes as...

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Bibliographic Details
Published in2005 8th European Conference on Radiation and Its Effects on Components and Systems pp. E1-1 - E1-4
Main Authors Granlund, T., Olsson, N.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.09.2005
Subjects
Aerospace electronics
Manufacturing
Mesons
Neutrons
Protons
Random access memory
Single event transient
Telephony
Testing
Thermal conductivity
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Summary:We report on experimental SEU studies using thermal and high-energy neutrons, conducted at the TRIUMF facility, Vancouver. Different SRAM samples were used and many samples showed to be highly susceptible to thermal neutrons. Moreover, a considerable part of the total SEU-rate, at high altitudes as well as down at sea level, may be attributed to thermal neutrons for RAM based devices.
ISBN:9780780395015
0780395018
ISSN:0379-6566
DOI:10.1109/RADECS.2005.4365587