3-D Morphological Analysis of Carbon-Nickel Nanocomposite Thin Films

The study's aim was to identify the 3-D surface spatial parameters that describe the 3-D surface microtexture of the nickel–carbon (Ni–C) nanocomposite thin films composed of Ni nanoparticles with different average sizes embedded in amorphous hydrogenated carbon, prepared by the combining radio...

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Published inApplied Mechanics and Materials Vol. 896; pp. 311 - 320
Main Authors Ţălu, Ştefan, Vintilă, Daniela, Rąplewicz, Alicja, Stach, Sebastian, Ţălu, Mihai
Format Journal Article
LanguageEnglish
Published Zurich Trans Tech Publications Ltd 01.02.2020
Subjects
Atomic force microscopes
Atomic force microscopy
Carbon
Magnetron sputtering
Microtexture
Nanocomposites
Nanoparticles
Nickel
Parameter identification
Plasma enhanced chemical vapor deposition
Thin films
Atomic Force Microscopy
Nickel-Carbon (Ni-C) Nanocomposite Thin Films
Stereometric Analysis
Three-Dimensional Surface Microtexture
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Summary:The study's aim was to identify the 3-D surface spatial parameters that describe the 3-D surface microtexture of the nickel–carbon (Ni–C) nanocomposite thin films composed of Ni nanoparticles with different average sizes embedded in amorphous hydrogenated carbon, prepared by the combining radio frequency magnetron sputtering technique and plasma-enhanced chemical vapor deposition (RF-PECVD). The deposition time was varied at 7, 10 and 13 min, respectively. The sample investigation was performed using an atomic force microscope, and the obtained data were analyzed and visualized using MountainsMap® Premium software to determine their stereometric surface engineering characteristics. The results from this study provide not only fundamental insights into the texture characteristics, but also directions toward their implementation in nanotribological models.
Bibliography:Selected, peer reviewed papers from the 5th International Conference of Mechanical Engineering (ICOME 2019), October 24-25, 2019, Craiova, Romania
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ISBN:9783035715934
3035715939
ISSN:1660-9336
1662-7482
1662-7482
DOI:10.4028/www.scientific.net/AMM.896.311