A 6-bit drift-resilient readout scheme for multi-level Phase-Change Memory

Multiple-Level Cell (MLC) storage provides increased capacity and hence reduced cost-per-bit in memory technologies, thereby rendering such technologies suitable for big data applications. In Phase-Change Memory (PCM), however, MLC storage is seriously hampered by the phenomenon of resistance drift....

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Published in2014 IEEE Asian Solid-State Circuits Conference (A-SSCC) pp. 137 - 140
Main Authors Athmanathan, Aravinthan, Stanisavljevic, Milos, Cheon, Junho, Kang, Seokjoon, Ahn, Changyong, Yoon, Junghyuk, Shin, Minchul, Kim, Taekseung, Papandreou, Nikolaos, Pozidis, Haris, Eleftheriou, Evangelos
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.11.2014
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Summary:Multiple-Level Cell (MLC) storage provides increased capacity and hence reduced cost-per-bit in memory technologies, thereby rendering such technologies suitable for big data applications. In Phase-Change Memory (PCM), however, MLC storage is seriously hampered by the phenomenon of resistance drift. We present a readout circuit for PCM specifically designed for drift resilience in MLC operation. Drift resilience is achieved through the use of specific non-resistance-based cell-state metrics which, in contrast to the traditional cell-state metric, i.e., the low-field electrical resistance, have built-in drift robustness. The circuit provides a fast and efficient implementation of drift-resilient metric, enabling, for the first time, the performance required by non volatile memory applications. In addition, by exploiting the non linear sub-threshold I-V characteristics of PCM cells, the readout architecture promises to increase the distinguishable signal range. The proposed read circuitry is designed and fabricated in 64-nm CMOS technology. Experimental results using an integrated test resistor array for readout circuit characterization are presented, demonstrating access time of 450 ns at 6-bit raw (5-bit effective) resolution. The circuit has low-noise characteristics and does not exhibit sensitivity to bit-line parasitics. The readout circuit is co-integrated with a 16 Mb 2x-nm PCM cell array and the necessary programming electronics.
ISBN:1479940909
9781479940905
DOI:10.1109/ASSCC.2014.7008879