Addressing Pseudo-Symmetric Misindexing in EBSD Analysis of γ-TiAl with High Accuracy Band Detection

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Bibliographic Details
Published in	Microscopy and microanalysis Vol. 21; no. S3; pp. 2037 - 2038
Main Authors	Sitzman, Scott, Schmidt, Niels-Henrik, Palomares-Garcia, Alberto, Munoz-Moreno, Rocio, Goulden, Jenny
Format	Journal Article
Language	English
Published	New York, USA Cambridge University Press 01.08.2015
Subjects	A10 Advances in Electron Diffraction and Automated Mapping Techniques Analytical and Instrumentation Science Symposia
Online Access	Get full text

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ISSN:	1431-9276 1435-8115
DOI:	10.1017/S143192761501096X