Wavelength-Scanning Method for Identifying Vertical Position of Film Using Surface Plasmon Microscopes

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 51; no. 11R; p. 112401
Main Authors Watanabe, Koyo, Matsuura, Koji
Format Journal Article
LanguageEnglish
Japanese
Published 01.11.2012
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ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.51.112401