MP-A7 observation of high-field transport in silicon inversion layers by a time-of-flight technique

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Bibliographic Details
Published inIEEE transactions on electron devices Vol. 27; no. 11; p. 2179
Main Authors Cooper, J.A., Nelson, D.F.
Format Journal Article
LanguageEnglish
Published IEEE 01.11.1980
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ISSN:0018-9383
1557-9646
DOI:10.1109/T-ED.1980.20182