Methods of detecting contaminants on electron device components

The need for test methods contaminant studies and control of parts processing is reviewed, with major emphasis on tests which are simple, nondestructive, and sensitive.

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Bibliographic Details
Published inI.R.E. transactions on electron devices Vol. 4; no. 2; p. 190
Main Author Feder, D.O.
Format Journal Article
LanguageEnglish
Published 01.04.1957
Subjects
Electron tubes
Image color analysis
Pollution measurement
Seals
Sensitivity
Telephone sets
Water
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Summary:The need for test methods contaminant studies and control of parts processing is reviewed, with major emphasis on tests which are simple, nondestructive, and sensitive.
ISSN:0096-2430
2379-8661
DOI:10.1109/T-ED.1957.14248