Critical Current of Superconducting Films With Different In-Plane Orientations

• Published in: IEEE transactions on applied superconductivity Vol. 17; no. 2; pp. 3564 - 3568
• Main Authors: Lin, P.A., Chi, C.C., Rosenstein, B.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.06.2007; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: COPPER OXIDE; Critical current; Critical current density; CURRENT DENSITY; Deltas; DEPOSITION; Grain boundaries; In-plane orientations; low angle grain boundaries; MAGNETIC FIELD; Magnetic field measurement; Magnetic fields; Magnetic films; Orientation; Physics; Superconducting films; SUPERCONDUCTIVITY; Temperature dependence; Temperature measurement; vortex; Yttria stabilized zirconia; YTTRIUM OXIDE
• ISSN: 1051-8223; 1558-2515
• DOI: 10.1109/TASC.2007.901513

By using a pulsed-laser deposition (PLD) technique, we grow high quality YBa 2 Cu 3 O 7-delta films on YSZ (Yt-stabilized Zr) substrates with 0-degree and 45-degree in-plane orientations at 810degC and 690degC respectively. Surprisingly, despite the large difference in growth temperature the qualities of the films are almost the same. To study the subtle differences between these two types of films, we measured both the temperature and magnetic field dependencies of the critical current. Although there is very little difference in their magnetic field dependence, there is a distinct temperature dependence, i. e. J c (1 - T/T c ) proportional to (1 - T/T c ) 5/4 for 0 degree in-plane orientation and proportional to (1 - T/T c ) 3/2 for 45 degree in-plane orientation at temperatures near T c . We also studied the critical current densities with different fractions of mixed orientations, and found an empirical formula J c prop e 5alpha where alpha is the fraction of the majority domain.