Strain-Tunable Single Photon Sources in WSe 2 Monolayers

The appearance of single photon sources in atomically thin semiconductors holds great promises for the development of a flexible and ultracompact quantum technology in which elastic strain engineering can be used to tailor their emission properties. Here, we show a compact and hybrid two-dimensional...

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Published inNano letters Vol. 19; no. 10; pp. 6931 - 6936
Main Authors Iff, Oliver, Tedeschi, Davide, Martín-Sánchez, Javier, Moczała-Dusanowska, Magdalena, Tongay, Sefaattin, Yumigeta, Kentaro, Taboada-Gutiérrez, Javier, Savaresi, Matteo, Rastelli, Armando, Alonso-González, Pablo, Höfling, Sven, Trotta, Rinaldo, Schneider, Christian
Format Journal Article
LanguageEnglish
Published United States 09.10.2019
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Summary:The appearance of single photon sources in atomically thin semiconductors holds great promises for the development of a flexible and ultracompact quantum technology in which elastic strain engineering can be used to tailor their emission properties. Here, we show a compact and hybrid two-dimensional semiconductor-piezoelectric device that allows for controlling the energy of single photons emitted by quantum emitters localized in wrinkled WSe monolayers. We demonstrate that strain fields exerted by the piezoelectric device can be used to tune the energy of localized excitons in WSe up to 18 meV in a reversible manner while leaving the single photon purity unaffected over a wide range. Interestingly, we find that the magnitude and, in particular, the sign of the energy shift as a function of stress is emitter dependent. With the help of finite element simulations we suggest a simple model that explains our experimental observations and, furthermore, discloses that the type of strain (tensile or compressive) experienced by the quantum emitters strongly depends on their localization across the wrinkles. Our findings are of strong relevance for the practical implementation of single photon devices based on two-dimensional materials as well as for understanding the effects of strain on their emission properties.
ISSN:1530-6984
1530-6992
DOI:10.1021/acs.nanolett.9b02221