Bi n + cluster ion sources for investigation of a covalently immobilized mixed film composed of oligonucleotides and poly(2‐hydroxyethyl methacrylate) brushes

Abstract The ability of Bi n + cluster ion sources to provide information about the physical structure of an integrated film composed of oligonucleotides and non‐nucleic acid oligomers of poly(2‐hydroxyethyl methacrylate) (PHEMA) has been explored using static time‐of‐flight (ToF) SIMS (ToF‐SIMS). F...

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Bibliographic Details
Published inSurface and interface analysis Vol. 43; no. 1-2; pp. 322 - 325
Main Authors Wong, April K. Y., Sodhi, R. N. S., Krull, Ulrich J.
Format Journal Article
LanguageEnglish
Published 01.01.2011
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Summary:Abstract The ability of Bi n + cluster ion sources to provide information about the physical structure of an integrated film composed of oligonucleotides and non‐nucleic acid oligomers of poly(2‐hydroxyethyl methacrylate) (PHEMA) has been explored using static time‐of‐flight (ToF) SIMS (ToF‐SIMS). Fragment intensities from PHEMA and oligonucleotides were compared. Negative ion spectra indicated that the Bi 5 + source provided details that were either not apparent or at much reduced sensitivity when using Bi 3 + and Bi + sources. The Bi 3 + ion source provided higher secondary ion intensities for positive ion fragments, and more than 200‐fold selectivity for ionization of oligonucleotide in comparison to PHEMA when in mixture, even though the oligonucleotides were not immobilized as a coating superimposed on PHEMA. Copyright © 2010 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.3431