A snap-shot mode cryogenic readout circuit for QWIP IR FPAs

The design and measurement of a snap-shot mode cryogenic readout circuit(ROIC) for GaAs/AlGaAs QWIP FPAs was reported.CTIA input circuits with pixei level built-in electronic injection transistors were proposed to test the chip before assembly with a detector array.Design optimization techniques for...

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Bibliographic Details
Published inJournal of semiconductors no. 2; pp. 88 - 93
Main Author 马文龙 石寅 张耀辉 刘洪冰 谢保健
Format Journal Article
LanguageChinese
English
Published 01.02.2010
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ISSN1674-4926
DOI10.1088/1674-4926/31/2/025012

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Summary:The design and measurement of a snap-shot mode cryogenic readout circuit(ROIC) for GaAs/AlGaAs QWIP FPAs was reported.CTIA input circuits with pixei level built-in electronic injection transistors were proposed to test the chip before assembly with a detector array.Design optimization techniques for cryogenic and low power are analyzed.An experimental ROIC chip of a 128×128 array was fabricated in 0.35μm CMOS technology.Measurements showed that the ROIC could operate at 77 K with low power dissipation of 35 mW.The chip has a pixel charge capacity of 2.57×10^6 electrons and transimpedance of 1.4×10^7Ω.Measurements showed that the transimpedance non-uniformity was less than 5%with a 10 MHz readout speed and a 3.3 V supply voltage.
Bibliography:ROIC
transimpedance non-uniformity
CTIA
cryogenic
QWIP; ROIC; CTIA; cryogenic; transimpedance non-uniformity
QWIP
TN4
11-5781/TN
TN215
ISSN:1674-4926
DOI:10.1088/1674-4926/31/2/025012