A snap-shot mode cryogenic readout circuit for QWIP IR FPAs
The design and measurement of a snap-shot mode cryogenic readout circuit(ROIC) for GaAs/AlGaAs QWIP FPAs was reported.CTIA input circuits with pixei level built-in electronic injection transistors were proposed to test the chip before assembly with a detector array.Design optimization techniques for...
Saved in:
Published in | Journal of semiconductors no. 2; pp. 88 - 93 |
---|---|
Main Author | |
Format | Journal Article |
Language | Chinese English |
Published |
01.02.2010
|
Subjects | |
Online Access | Get full text |
ISSN | 1674-4926 |
DOI | 10.1088/1674-4926/31/2/025012 |
Cover
Summary: | The design and measurement of a snap-shot mode cryogenic readout circuit(ROIC) for GaAs/AlGaAs QWIP FPAs was reported.CTIA input circuits with pixei level built-in electronic injection transistors were proposed to test the chip before assembly with a detector array.Design optimization techniques for cryogenic and low power are analyzed.An experimental ROIC chip of a 128×128 array was fabricated in 0.35μm CMOS technology.Measurements showed that the ROIC could operate at 77 K with low power dissipation of 35 mW.The chip has a pixel charge capacity of 2.57×10^6 electrons and transimpedance of 1.4×10^7Ω.Measurements showed that the transimpedance non-uniformity was less than 5%with a 10 MHz readout speed and a 3.3 V supply voltage. |
---|---|
Bibliography: | ROIC transimpedance non-uniformity CTIA cryogenic QWIP; ROIC; CTIA; cryogenic; transimpedance non-uniformity QWIP TN4 11-5781/TN TN215 |
ISSN: | 1674-4926 |
DOI: | 10.1088/1674-4926/31/2/025012 |