Characterization of Tris (5-amino-1,10-phenanthroline) Ruthenium(II/III) Polymer Films Using Cyclic Voltammetry and Rutherford Backscattering Spectrometry

Abstract Platinum electrodes were chemically modified with tris(5-amino-1,10-phenanthroline) ruthenium(II) via electropolymerization. The characterization of the thin films was accomplished with cyclic voltammetry (CV) and Rutherford Backscattering Spectrometry (RBS). Data indicates a strong correla...

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Bibliographic Details
Published inInternational journal of chemistry Vol. 3; no. 4; p. 12
Main Authors Brown, Kenneth Lionel, Hou, Xisen, Banks, Olajide, A. Krueger, Kevin, Hinson, Julian, F. Peaslee, Graham, A. DeYoung, Paul, M. Alger, Shannon, Benzer, Jessica, L. Neils, Thomas
Format Journal Article
LanguageEnglish
Published 01.12.2011
Subjects
Atomic properties
Backscattering
Electrodes
Film thickness
Polymerization
Spectrometry
Spectroscopy
Voltammetry
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Summary:Abstract Platinum electrodes were chemically modified with tris(5-amino-1,10-phenanthroline) ruthenium(II) via electropolymerization. The characterization of the thin films was accomplished with cyclic voltammetry (CV) and Rutherford Backscattering Spectrometry (RBS). Data indicates a strong correlation between the peak currents from the characterization cyclic voltammograms and the number of cycles of electropoly-merization. Rutherford Backscattering Spectrometry showed the same trend, and verified that film thickness is strongly dependent on the concentration of the monomer ruthenium solution. Film thickness was determined from the change in ion beam energy as it passed through the film and was calculated to be 1.0 1018 atoms/cm super( 2) - 3.4 10 super( 18) atoms/cm super( 2), depending upon the number of electropolymerization cycles. The electrodes also showed differences in surface roughness, which were dependent on film thickness.
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ISSN:1916-9698
1916-9701
DOI:10.5539/ijc.v3n4p12