P‐82: Analysis and Validation of TFT‐LCD Data Open Mechanism

In this paper we reported a novel technology to improve Data Open. The relationship between process material and data open was analyzed between many materials. After a lot of experimental verification and analysis of the mechanism. A method to assess Data Open risk is developed with corresponding Cu...

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Bibliographic Details
Published inSID International Symposium Digest of technical papers Vol. 55; no. 1; pp. 1709 - 1712
Main Authors Xie, Zhongjing, Yang, Chunliu, Liang, Ping, Li, Ji
Format Journal Article
LanguageEnglish
Published Campbell Wiley Subscription Services, Inc 01.06.2024
Subjects
Climbing broken line
Cu acid
Data analysis
Data open
H2O2
Risk analysis
Technology assessment
TFT-LCD
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ISSN0097-966X
2168-0159
DOI10.1002/sdtp.17899

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Summary:In this paper we reported a novel technology to improve Data Open. The relationship between process material and data open was analyzed between many materials. After a lot of experimental verification and analysis of the mechanism. A method to assess Data Open risk is developed with corresponding Cu acid standards process change to ensure product reliability requirements are met.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:0097-966X
2168-0159
DOI:10.1002/sdtp.17899