Corrections to "Amplitude and phase drift correction of EFPI sensor systems using both adaptive Kalman filter and temperature compensation for nanometric displacement estimation" [Jul 12 2195-2202]

In the above-named article [ibid., vol. 30, no. 13, pp. 2195-2202, Jul. 2012], the affiliation of H.S. Seat and M. Catteon should be modified to read as: "H.C. Seat and M. Catteon are with the Optoelectronics for Embedded Systems Group, Laboratory for Analysis and Architecture of Systems (LAAS)...

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Bibliographic Details
Published inJournal of lightwave technology Vol. 31; no. 10; p. 1670
Main Authors Chawah, P., Sourice, A., Plantier, G., Seat, H. C., Boudin, F., Chery, J., Cattoen, M., Bernard, P., Brunet, C., Gaffet, S., Boyer, D.
Format Journal Article
LanguageEnglish
Published IEEE 15.05.2013
Subjects
Adaptive optics
Demodulation
Displacement measurement
Kalman filters
Optical sensors
Temperature measurement
Temperature sensors
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Summary:In the above-named article [ibid., vol. 30, no. 13, pp. 2195-2202, Jul. 2012], the affiliation of H.S. Seat and M. Catteon should be modified to read as: "H.C. Seat and M. Catteon are with the Optoelectronics for Embedded Systems Group, Laboratory for Analysis and Architecture of Systems (LAAS), CNRS, 31400 Toulouse, France, and also with the Université de Toulouse, INP, LAAS, F-31400 Toulouse, France."
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2013.2256858