Magnetic and structural changes in the near-surface epitaxial Y 2.95 La 0.05 Fe 5 O 12 films after high-dose ion implantation

The method of magnetic force microscopy was used to study the domain structure of various-thickness epitaxial Y La Fe O iron-yttrium garnet films modified by high-dose implantation of N nitrogen ions. The results of multi-crystal x-ray diffractometry were analyzed, and a possible defect structure of...

Full description

Saved in:
Bibliographic Details
Published inApplied optics. Optical technology and biomedical optics Vol. 55; no. 12; p. B144
Main Authors Fodchuk, I M, Gutsuliak, I I, Dovganiuk, V V, Kotsyubynskiy, A O, Pietsch, U, Pashniak, N V, Bonchyk, O Yu, Syvorotka, I M, Lytvyn, P M
Format Journal Article
LanguageEnglish
Published United States 20.04.2016
Online AccessGet more information

Cover

Loading…
More Information
Summary:The method of magnetic force microscopy was used to study the domain structure of various-thickness epitaxial Y La Fe O iron-yttrium garnet films modified by high-dose implantation of N nitrogen ions. The results of multi-crystal x-ray diffractometry were analyzed, and a possible defect structure of garnets prior to and after implantation was identified. It was established that the reduction of magnetic losses observed after high-dose ion implantation is accompanied by the essential ordering of magnetic domains on the surface of implanted films. There is a direct dependence of electromagnetic properties on the dose of implanted atoms followed by a considerable sputtering and amorphization of the near-surface film layer and formation of a well-defined electromagnetic structure.
ISSN:2155-3165
DOI:10.1364/AO.55.00B144