Misfit structure of MBE grown silicon on galliumphosphide by means of high resolution electron microscopy

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Bibliographic Details
Published inUltramicroscopy Vol. 15; no. 4; p. 395
Main Authors Bulle-Lieuwma, C.W.T., Viegers, M.P.A.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 1984
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ISSN:0304-3991
1879-2723
DOI:10.1016/0304-3991(84)90166-9