Crystallinity and in-field characterization of high-T c YBa 2 Cu 4 0 8 and Y 0.9 Ca 0.1 Ba 2 Cu 4 O 8 epitaxial films fabricated by low temperature flux method

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Bibliographic Details
Published inJournal of physics. Conference series Vol. 507; no. 1; p. 12016
Main Authors Funaki, S, Yamada, Y, Nakayama, F
Format Journal Article
LanguageEnglish
Published 12.05.2014
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ISSN:1742-6596
1742-6596
DOI:10.1088/1742-6596/507/1/012016