Refractive index of silicon oxide surface films determined by polarization method of photomagnetoelectric investigation

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Bibliographic Details
Published inSurface science letters Vol. 140; no. 2; p. A170
Main Authors Nowak, M., Łoś, S., Kończak, S.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.05.1984
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ISSN:0167-2584
DOI:10.1016/0167-2584(84)90193-2