Free-volume defects investigation of GeS 2 -Ga 2 S 3 -CsI chalcogenide glasses by positron annihilation spectroscopy
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Published in | Infrared physics & technology Vol. 83; pp. 238 - 242 |
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Main Authors | , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
01.06.2017
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Online Access | Get full text |
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ISSN: | 1350-4495 |
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DOI: | 10.1016/j.infrared.2017.04.012 |