Multifrequency Kelvin probe force microscopy on self assembled molecular layers and quantitative assessment of images’ quality
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Published in | Ultramicroscopy Vol. 194; pp. 100 - 107 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
01.11.2018
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Online Access | Get full text |
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ISSN: | 0304-3991 |
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DOI: | 10.1016/j.ultramic.2018.08.002 |