Graphene nanoribbon field-effect transistor at high bias
Combination of high-mean free path and scaling ability makes graphene nanoribbon (GNR) attractive for application of field-effect transistors and subject of intense research. Here, we study its behaviour at high bias near and after electrical breakdown. Theoretical modelling, Monte Carlo simulation,...
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Published in | Nanoscale research letters Vol. 9; no. 1; p. 604 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
New York
Springer New York
06.11.2014
Springer Nature B.V BioMed Central Ltd Springer |
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ISSN | 1556-276X 1931-7573 1556-276X |
DOI | 10.1186/1556-276X-9-604 |
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Abstract | Combination of high-mean free path and scaling ability makes graphene nanoribbon (GNR) attractive for application of field-effect transistors and subject of intense research. Here, we study its behaviour at high bias near and after electrical breakdown. Theoretical modelling, Monte Carlo simulation, and experimental approaches are used to calculate net generation rate, ionization coefficient, current, and finally breakdown voltage (BV). It is seen that a typical GNR field-effect transistor's (GNRFET) breakdown voltage is in the range of 0.5 to 3 V for different channel lengths, and compared with silicon similar counterparts, it is less. Furthermore, the likely mechanism of breakdown is studied. |
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AbstractList | Combination of high-mean free path and scaling ability makes graphene nanoribbon (GNR) attractive for application of field-effect transistors and subject of intense research. Here, we study its behaviour at high bias near and after electrical breakdown. Theoretical modelling, Monte Carlo simulation, and experimental approaches are used to calculate net generation rate, ionization coefficient, current, and finally breakdown voltage (BV). It is seen that a typical GNR field-effect transistor's (GNRFET) breakdown voltage is in the range of 0.5 to 3 V for different channel lengths, and compared with silicon similar counterparts, it is less. Furthermore, the likely mechanism of breakdown is studied. Combination of high-mean free path and scaling ability makes graphene nanoribbon (GNR) attractive for application of field-effect transistors and subject of intense research. Here, we study its behaviour at high bias near and after electrical breakdown. Theoretical modelling, Monte Carlo simulation, and experimental approaches are used to calculate net generation rate, ionization coefficient, current, and finally breakdown voltage (BV). It is seen that a typical GNR field-effect transistor's (GNRFET) breakdown voltage is in the range of 0.5 to 3 V for different channel lengths, and compared with silicon similar counterparts, it is less. Furthermore, the likely mechanism of breakdown is studied. Combination of high-mean free path and scaling ability makes graphene nanoribbon (GNR) attractive for application of field-effect transistors and subject of intense research. Here, we study its behaviour at high bias near and after electrical breakdown. Theoretical modelling, Monte Carlo simulation, and experimental approaches are used to calculate net generation rate, ionization coefficient, current, and finally breakdown voltage (BV). It is seen that a typical GNR field-effect transistor's (GNRFET) breakdown voltage is in the range of 0.5 to 3 V for different channel lengths, and compared with silicon similar counterparts, it is less. Furthermore, the likely mechanism of breakdown is studied.Combination of high-mean free path and scaling ability makes graphene nanoribbon (GNR) attractive for application of field-effect transistors and subject of intense research. Here, we study its behaviour at high bias near and after electrical breakdown. Theoretical modelling, Monte Carlo simulation, and experimental approaches are used to calculate net generation rate, ionization coefficient, current, and finally breakdown voltage (BV). It is seen that a typical GNR field-effect transistor's (GNRFET) breakdown voltage is in the range of 0.5 to 3 V for different channel lengths, and compared with silicon similar counterparts, it is less. Furthermore, the likely mechanism of breakdown is studied. |
ArticleNumber | 604 |
Author | Manaf, Asrulnizam Abd Ghadiry, Mahdiar Ismail, Razali Saeidmanesh, Mehdi Khaledian, Mohsen |
AuthorAffiliation | 1 Faculty of Electrical Engineering, Universiti Teknologi Malaysia, Skudai, Johor Darul Takzim 81310, Malaysia 2 School of Electrical and Electronic Engineering, Univesiti Sains Malaysia, Pulau Pinang 14300, Malaysia |
AuthorAffiliation_xml | – name: 2 School of Electrical and Electronic Engineering, Univesiti Sains Malaysia, Pulau Pinang 14300, Malaysia – name: 1 Faculty of Electrical Engineering, Universiti Teknologi Malaysia, Skudai, Johor Darul Takzim 81310, Malaysia |
Author_xml | – sequence: 1 givenname: Mahdiar surname: Ghadiry fullname: Ghadiry, Mahdiar organization: Faculty of Electrical Engineering, Universiti Teknologi Malaysia – sequence: 2 givenname: Razali surname: Ismail fullname: Ismail, Razali email: razali@fke.utm.my organization: Faculty of Electrical Engineering, Universiti Teknologi Malaysia – sequence: 3 givenname: Mehdi surname: Saeidmanesh fullname: Saeidmanesh, Mehdi organization: Faculty of Electrical Engineering, Universiti Teknologi Malaysia – sequence: 4 givenname: Mohsen surname: Khaledian fullname: Khaledian, Mohsen organization: Faculty of Electrical Engineering, Universiti Teknologi Malaysia – sequence: 5 givenname: Asrulnizam Abd surname: Manaf fullname: Manaf, Asrulnizam Abd organization: School of Electrical and Electronic Engineering, Univesiti Sains Malaysia |
BackLink | https://www.ncbi.nlm.nih.gov/pubmed/25404874$$D View this record in MEDLINE/PubMed |
BookMark | eNp9UU1rGzEQFSWl-TznFhZ66WWbkVYf60uhNW1aCPSSQ29C0o5shbXkSutA_n1lnBonND2NmHnv6c2bU3IUU0RCLil8pLSX11QI2TIlf7WzVgJ_Q072naOD9zE5LeUegCtQ8h05ZoID7xU_If1NNuslRmyiiSkHa1NsfMBxaNF7dFMzZRNLKFPKjZmaZVgsGxtMOSdvvRkLXjzVM3L37evd_Ht7-_Pmx_zzbWsFo1OLFFinfE8746RFtFwocAid4t4DmJ4zxaQRfnAwE4YqgW4Y5ABGUTvw7ox82smuN3aFg8NY_Yx6ncPK5EedTNDPJzEs9SI9aM461lNRBb7sBGxIrwg8n7i00tvg9DY4PdM11iry4clFTr83WCa9CsXhOJqIaVM0lUxSKTjvK_T9C-h92uRYI9JUQQ-MctVV1NXhWns7fw9TAdc7gMuplIx-D6Ggt6f_h0fxguHCZKaQtmuF8T882PFK_SEuMB8YfoXyB8umwdw |
CitedBy_id | crossref_primary_10_1007_s11468_015_0073_5 crossref_primary_10_1007_s11664_019_07528_5 crossref_primary_10_1088_1742_6596_1676_1_012123 crossref_primary_10_1080_03772063_2016_1147390 crossref_primary_10_1109_TNANO_2019_2936521 crossref_primary_10_1149_2162_8777_ac5eb3 crossref_primary_10_3390_cryst8060239 crossref_primary_10_1007_s00339_018_2193_1 crossref_primary_10_1186_s11671_016_1553_z crossref_primary_10_1007_s11468_019_00964_3 crossref_primary_10_1088_1742_6596_1676_1_012164 |
Cites_doi | 10.1103/PhysRevB.84.125450 10.1088/0953-8984/23/5/055802 10.1166/jctn.2014.3357 10.1063/1.4761995 10.1063/1.3592841 10.1063/1.3483130 10.1016/j.microrel.2011.07.009 10.1063/1.3147183 10.1016/j.microrel.2012.12.002 10.1142/S0218126611007323 10.1103/PhysRevLett.106.256801 10.1109/LED.2011.2108259 10.1109/LED.2008.922971 10.1063/1.3615286 |
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Copyright | Ghadiry et al.; licensee Springer. 2014. This article is published under license to BioMed Central Ltd. This is an Open Access article distributed under the terms of the Creative Commons Attribution License ( ), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly credited. Copyright Springer Nature B.V. Dec 2014 Copyright © 2014 Ghadiry et al.; licensee Springer. 2014 Ghadiry et al.; licensee Springer. |
Copyright_xml | – notice: Ghadiry et al.; licensee Springer. 2014. This article is published under license to BioMed Central Ltd. This is an Open Access article distributed under the terms of the Creative Commons Attribution License ( ), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly credited. – notice: Copyright Springer Nature B.V. Dec 2014 – notice: Copyright © 2014 Ghadiry et al.; licensee Springer. 2014 Ghadiry et al.; licensee Springer. |
DBID | C6C AAYXX CITATION NPM 7QF 7QO 7QQ 7SC 7SE 7SP 7SR 7TA 7TB 7U5 8BQ 8FD 8FE 8FG 8FH ABJCF ABUWG AEUYN AFKRA AZQEC BBNVY BENPR BGLVJ BHPHI CCPQU D1I DWQXO F28 FR3 GNUQQ H8D H8G HCIFZ JG9 JQ2 KB. KR7 L7M LK8 L~C L~D M7P P64 PDBOC PHGZM PHGZT PIMPY PKEHL PQEST PQGLB PQQKQ PQUKI PRINS 7X8 5PM |
DOI | 10.1186/1556-276X-9-604 |
DatabaseName | Springer Nature OA Free Journals CrossRef PubMed Aluminium Industry Abstracts Biotechnology Research Abstracts Ceramic Abstracts Computer and Information Systems Abstracts Corrosion Abstracts Electronics & Communications Abstracts Engineered Materials Abstracts Materials Business File Mechanical & Transportation Engineering Abstracts Solid State and Superconductivity Abstracts METADEX Technology Research Database ProQuest SciTech Collection ProQuest Technology Collection ProQuest Natural Science Collection SciTech Premium Collection ProQuest Central (Alumni) ProQuest One Sustainability (subscription) ProQuest Central UK/Ireland ProQuest Central Essentials Biological Science Collection ProQuest Central Technology Collection Natural Science Collection ProQuest One ProQuest Materials Science Collection ProQuest Central ANTE: Abstracts in New Technology & Engineering Engineering Research Database ProQuest Central Student Aerospace Database Copper Technical Reference Library SciTech Premium Collection Materials Research Database ProQuest Computer Science Collection Materials Science Database Civil Engineering Abstracts Advanced Technologies Database with Aerospace Biological Sciences Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional Biological Science Database Biotechnology and BioEngineering Abstracts Materials Science Collection ProQuest Central Premium ProQuest One Academic Publicly Available Content Database ProQuest One Academic Middle East (New) ProQuest One Academic Eastern Edition (DO NOT USE) ProQuest One Applied & Life Sciences ProQuest One Academic ProQuest One Academic UKI Edition ProQuest Central China MEDLINE - Academic PubMed Central (Full Participant titles) |
DatabaseTitle | CrossRef PubMed Publicly Available Content Database Materials Research Database ProQuest Central Student ProQuest Central Essentials ProQuest Computer Science Collection Computer and Information Systems Abstracts SciTech Premium Collection ProQuest Central China Materials Business File ProQuest One Applied & Life Sciences ProQuest One Sustainability Engineered Materials Abstracts Natural Science Collection Biological Science Collection ProQuest Central (New) ANTE: Abstracts in New Technology & Engineering Aluminium Industry Abstracts ProQuest Biological Science Collection ProQuest One Academic Eastern Edition Electronics & Communications Abstracts ProQuest Technology Collection Ceramic Abstracts Biological Science Database Biotechnology and BioEngineering Abstracts ProQuest One Academic UKI Edition Solid State and Superconductivity Abstracts Engineering Research Database ProQuest One Academic ProQuest One Academic (New) Technology Collection Technology Research Database Computer and Information Systems Abstracts – Academic ProQuest One Academic Middle East (New) Mechanical & Transportation Engineering Abstracts Materials Science Collection ProQuest Central (Alumni Edition) ProQuest One Community College ProQuest Natural Science Collection ProQuest Central Aerospace Database Copper Technical Reference Library Biotechnology Research Abstracts ProQuest Central Korea Materials Science Database Advanced Technologies Database with Aerospace ProQuest Materials Science Collection Civil Engineering Abstracts ProQuest SciTech Collection METADEX Computer and Information Systems Abstracts Professional Materials Science & Engineering Collection Corrosion Abstracts MEDLINE - Academic |
DatabaseTitleList | CrossRef Publicly Available Content Database MEDLINE - Academic PubMed |
Database_xml | – sequence: 1 dbid: C6C name: Springer Nature OA Free Journals url: http://www.springeropen.com/ sourceTypes: Publisher – sequence: 2 dbid: NPM name: PubMed url: https://proxy.k.utb.cz/login?url=http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed sourceTypes: Index Database – sequence: 3 dbid: 8FG name: ProQuest Technology Collection url: https://search.proquest.com/technologycollection1 sourceTypes: Aggregation Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering |
EISSN | 1556-276X |
EndPage | 604 |
ExternalDocumentID | PMC4232815 oai_biomedcentral_com_1556_276X_9_604 3791718001 25404874 10_1186_1556_276X_9_604 |
Genre | Journal Article |
GroupedDBID | -A0 .4S .86 .DC 0R~ 123 29M 2WC 4.4 40G 5VS 6NX 8FE 8FG 8FH AAFWJ ABJCF ABMNI ACGFO ACGFS ACIWK ACPRK ADBBV ADINQ ADRAZ AEGXH AENEX AEUYN AFGCZ AFKRA AFPKN AFRAH AHBYD AHSBF AHYZX ALMA_UNASSIGNED_HOLDINGS AMKLP AMTXH AOIJS ARCSS BAPOH BBNVY BCNDV BENPR BGLVJ BGNMA BHPHI C24 C6C CAG CCPQU CS3 D1I DU5 EBS EDO EJD F5P GROUPED_DOAJ GX1 H13 HCIFZ HH5 HYE HZ~ I09 IPNFZ IZQ KB. KDC KQ8 LK8 M48 M4Y M7P MM. M~E NU0 O5R O5S O9- OK1 P2P PDBOC PGMZT PIMPY PROAC RIG RNS RPM RPX RSV SCM SDH SOJ TR2 TUS U2A ~KM AAYXX CITATION OVT 2VQ C1A COF NPM PHGZM PHGZT PQGLB TSK 7QF 7QO 7QQ 7SC 7SE 7SP 7SR 7TA 7TB 7U5 8BQ 8FD ABUWG AZQEC DWQXO F28 FR3 GNUQQ H8D H8G JG9 JQ2 KR7 L7M L~C L~D P64 PKEHL PQEST PQQKQ PQUKI PRINS 7X8 AAJSJ AAKKN AAYZJ ACACY AFGXO AHBXF 5PM |
ID | FETCH-LOGICAL-b521t-e10237f813ac6beeb4570ce0374ff00a842726a5fdc095a175ecdd6d0a71bd43 |
IEDL.DBID | M48 |
ISSN | 1556-276X 1931-7573 |
IngestDate | Thu Aug 21 18:11:58 EDT 2025 Wed May 22 07:11:53 EDT 2024 Fri Jul 11 06:19:48 EDT 2025 Mon Jun 30 09:08:47 EDT 2025 Mon Jul 21 05:37:40 EDT 2025 Tue Jul 01 03:54:24 EDT 2025 Thu Apr 24 23:09:03 EDT 2025 Fri Feb 21 02:38:04 EST 2025 |
IsDoiOpenAccess | true |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1 |
Keywords | Fabrication Breakdown Model High bias Graphene Current |
Language | English |
License | This is an Open Access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly credited. |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-b521t-e10237f813ac6beeb4570ce0374ff00a842726a5fdc095a175ecdd6d0a71bd43 |
Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
OpenAccessLink | http://journals.scholarsportal.info/openUrl.xqy?doi=10.1186/1556-276X-9-604 |
PMID | 25404874 |
PQID | 1708021473 |
PQPubID | 2034687 |
PageCount | 1 |
ParticipantIDs | pubmedcentral_primary_oai_pubmedcentral_nih_gov_4232815 biomedcentral_primary_oai_biomedcentral_com_1556_276X_9_604 proquest_miscellaneous_1626165448 proquest_journals_1708021473 pubmed_primary_25404874 crossref_primary_10_1186_1556_276X_9_604 crossref_citationtrail_10_1186_1556_276X_9_604 springer_journals_10_1186_1556_276X_9_604 |
ProviderPackageCode | CITATION AAYXX |
PublicationCentury | 2000 |
PublicationDate | 2014-11-06 |
PublicationDateYYYYMMDD | 2014-11-06 |
PublicationDate_xml | – month: 11 year: 2014 text: 2014-11-06 day: 06 |
PublicationDecade | 2010 |
PublicationPlace | New York |
PublicationPlace_xml | – name: New York – name: United States – name: Heidelberg |
PublicationTitle | Nanoscale research letters |
PublicationTitleAbbrev | Nanoscale Res Lett |
PublicationTitleAlternate | Nanoscale Res Lett |
PublicationYear | 2014 |
Publisher | Springer New York Springer Nature B.V BioMed Central Ltd Springer |
Publisher_xml | – name: Springer New York – name: Springer Nature B.V – name: BioMed Central Ltd – name: Springer |
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SSID | ssj0047076 |
Score | 2.1257112 |
Snippet | Combination of high-mean free path and scaling ability makes graphene nanoribbon (GNR) attractive for application of field-effect transistors and subject of... |
SourceID | pubmedcentral biomedcentral proquest pubmed crossref springer |
SourceType | Open Access Repository Aggregation Database Index Database Enrichment Source Publisher |
StartPage | 604 |
SubjectTerms | Bias Chemistry and Materials Science Electric potential Electrical faults Field effect transistors Graphene Ionization Ionization coefficients Materials Science Molecular Medicine Monte Carlo simulation Nano Express Nanochemistry Nanoribbons Nanoscale Science and Technology Nanotechnology Nanotechnology and Microengineering Semiconductor devices Voltage |
SummonAdditionalLinks | – databaseName: ProQuest Technology Collection dbid: 8FG link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1Lj9MwEB5BucBhxS6vQHcVJA5wMM3DsR3tASFEWyHBqUi9WbbjiEpVWrbt_2fGTbpNC5xtx_HYnvns8XwD8E6UxHmJG8lVPme8cpLZLKlYVkrLrbNV5ShQ-PsPMf3Jv82LeXvhtmmfVXY6MSjqauXojnyUSooKTbnMP61_M8oaRd7VNoXGQ3iUoqWhFa7Gk04Tc5mE5HKIUVImC5m31D6pEiM0o4JlUsxZyURyGu6-7FupM-h5_oLyxI0arNP4KVy0sDL-vF8Hl_DAN1fw5Ihs8BmoCXFTo2qLG9PgyKxdNXF4wMb2jzriLdmtQBsSm21MRMaxXZjNc5iNv86-TFmbN4FZSk_APNExyFqluXHCem95IRPKCyZ5XSeJUTyTmTBFXTkEWAYBhHeUWCoxMrUVz1_AoFk1_hXEPEc4USPmU05wJUqsywvnauNVnqOui-C2Jza93lNkaCKt7pfgXGoSuiah61Kj0CP42AlZu5aRnBJjLHU4mShx3uD9oUHX0z-rDrtZ0-2u3Oj7NRTB20Mx7idykpjGr3ZYB094FOHFVQQv95N86AsP06jwJH5c9qa_N-x-SbP4FTi7yR-u0iKCD91COfqtvw_h9f-H8AYeI3jjIS5SDGGwvdv5awRIW3sTdsEfnMYN1Q priority: 102 providerName: ProQuest – databaseName: Springer Open Access Hybrid - NESLI2 2011-2012 dbid: 40G link: http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV07T8QwDLYQLDAg3pSXisQAQ6CPNEnFhBAPIcEE0m1RkqbiJNRDx_H_sXPtiXIwMMdpWrt2bNn-DHAiSsK8REVylc8Zr5xkNksqlpXScutsVTlqFH58Evcv_GFQDBYg7XphQrV7l5IMljqotRIXePEJlkkxYCUThAC6RFhiFG_x5K4zvlxiXN4i-Pyy6UdX-1v_MprzMOcLJX9kS8MldLsGq633GF9Nxb0OC77ZgJVvmIKbgEG_obotHzemGY2H1o6aONSpsWntRjyh6ymgg8RmEhNecWyH5mMLnm9vnq_vWTsegVmaQsA8oS7IWqW5ccJ6b3khExr_JXldJ4lRPJOZMEVdOfSjDPoJ3tH8qMTI1FY834bFZtT4XYh5jl5Dja6dcoIrUSItL5yrjVd5jiYtgsse2_T7FAlDEzZ1fwUlponpmpiuS41Mj-C8Y7J2LfA4zb940yEAUWJ-w-lsQ3fSn6QHndR0q3wfOpXUQJxymUdwPFtGtaFciGn86BNpMJCjRi6uItiZCnl2FsbMaNckPlz2xN_77P5KM3wN0NyU9lZpEcFZ96N8e63fP2HvH7T7sIwOGw-9kOIAFifjT3-ITtHEHgU1-ALF-geG priority: 102 providerName: Springer Nature |
Title | Graphene nanoribbon field-effect transistor at high bias |
URI | https://link.springer.com/article/10.1186/1556-276X-9-604 https://www.ncbi.nlm.nih.gov/pubmed/25404874 https://www.proquest.com/docview/1708021473 https://www.proquest.com/docview/1626165448 http://dx.doi.org/10.1186/1556-276X-9-604 https://pubmed.ncbi.nlm.nih.gov/PMC4232815 |
Volume | 9 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV3Na9swFH9s7WU7jO7baxc82GE7qHNsWZIpZXShaRm0jNFAbkKSZRoIzpamsP33e0-xvbrJTrsIjL6sJz29p6_fD-C9KAjzEhXJlT5jvHSS2TQpWVpIy62zZenoofDFpTif8K_TfPqXDqgR4M3WpR3xSU2W88NfP39_RoU_DgqvxCc0iYKlUkxZwQRhg-6iWZLE43DBuyMFLpPANNclbnB-thRw7-37vG-yNvzQzeuU985Ug6ka78GTxseMT9aD4ik88PUzeHwHefA5qDMCqsZ5Lq5NvVjOrF3UcbjNxtY3POIVGbGAIRKbVUyoxrGdmZsXcDU-vRqds4ZEgVniKmCesBlkpYaZccJ6b3kuEyIJk7yqksQonspUmLwqHXpbBr0J74hlKjFyaEuevYSdelH71xDzDH2LCh1A5QRXosC0PHeuMl5lGU58ERz1xKZ_rPEyNCFY92NQmTQJXZPQdaFR6BEctkLWroEnJ5aMuQ7LFCU2M3zoMrQ1_TPpQdtruh1hGkeIIsA4mUXwrotG5aITE1P7xS2mweUePffiKoJX607u6sKVNc5-EguXve7vNbsfU8-uA4A3HY6rYR7Bx3ag3Pmt7U1481_C3YdH6Ojx8IZSHMDOannr36IztbIDeMiTMwzVGMPdL6eX377j10iMBmF7YhCUaBB2wTCcpCd_AFu3I8w |
linkProvider | Scholars Portal |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1Lb9QwEB6VcgAOqLwDBYIEEhzcJrFjO6oqhIDtlj5Oi7Q3y3YcUanKFnYrxI_iP3Ymj6XpAree_YrH45lxZuYbgNeyIMxLvEi-DJyJ0ivmsqRkWaGccN6VpadE4aNjOf4qvkzz6Rr87nNhKKyyl4mNoC5nnv6Rb6eKskJTofj7s--MqkaRd7UvodGyxUH49ROfbPPd_U94vm-ybPR58nHMuqoCzBF4PwsEVqAqnXLrpQvBiVwlVDVLiapKEqtFpjJp86r0aH5YVK_BU9mlxKrUlYLjtDfgpuC8oAhCPdrrBb9QSVPLDk2ilKlc8Q5JKNVyG7W2ZJmSU1YwmVzNrj8dKsUVS3c1YPOK17ZRhqMNuNtZsfGHlu3uwVqo78OdS9iGD0DvERQ2StK4tjUS0rlZHTfxcqyNIYkXpCYblJLYLmLCTY7diZ0_hMl1EPQRrNezOjyBWHC0Xio0MbWXQssC-4rc-8oGzTmK1gh2BmQzZy0ihyGM7GELso4hohsiuikMEj2CrZ7IxncA6FSH49Q0DyEtVwe8XQ7oV_pn183-1EwnBObmD8tG8GrZjNeXfDK2DrNz7IMPSkooEzqCx-0hL9fCtzvKV4WTq8HxD7Y9bKlPvjUQ4eR-12kewbueUS591t-38PT_W3gJt8aTo0NzuH988Axuo90ompRMuQnrix_n4TnaZgv3orkRMZhrvoEXx2ZKmw |
linkToPdf | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1Lb9QwEB6VIiE4oPIOFDASSHBwNw_HdoQQQpRtS6HiUKS9WbbjiEpVtu1uVfWn8e86k8fSdIFbz3b8GM_L8cw3AK9lQZiXKEi-DBkXpVfcpXHJ00I54bwrS0-Jwt_35PZP8XWST1bgd58LQ2GVvU5sFHU59fSPfJQoygpNhMpGVRcW8WNz_PHomFMFKXpp7ctptCyyG87P8Po2-7CziWf9Jk3HX_Y_b_OuwgB3BOTPAwEXqEonmfXSheBErmKqoKVEVcWx1SJVqbR5VXp0RSya2uCpBFNsVeJKkeGwN-CmynBllKQ-3uqNgFBxU9cO3aOEq1xlHapQouUILbjkqZITXnAZX820PxwayCWvdzl488oLbmMYx2twt_No2aeWBe_BSqjvw51LOIcPQG8RLDZqVVbbGgnp3LRmTewcb-NJ2JxMZoNYwuycEYYycwd29hD2r4Ogj2C1ntbhCTCRoSdTobupvRRaFthX5N5XNugsQzUbwfsB2cxRi85hCC972IJsZIjohohuCoNEj2CjJ7LxHRg61eQ4NM2lSMvlD94uPuhn-mfX9f7UTKcQZuYP-0bwatGMokzvM7YO01Psg5dLSi4TOoLH7SEv5sJ7POpahYOrwfEPtj1sqQ9-NXDh9BSvkzyCdz2jXFrW37fw9P9beAm3UPbMt5293WdwG11I0WRnynVYnZ-chufops3di0YgGJhrFsALF0BOyA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Graphene+nanoribbon+field-effect+transistor+at+high+bias&rft.jtitle=Nanoscale+research+letters&rft.au=Ghadiry%2C+Mahdiar&rft.au=Ismail%2C+Razali&rft.au=Saeidmanesh%2C+Mehdi&rft.au=Khaledian%2C+Mohsen&rft.date=2014-11-06&rft.pub=BioMed+Central+Ltd&rft.issn=1556-276X&rft.eissn=1556-276X&rft.volume=9&rft.issue=1&rft.spage=604&rft.epage=604&rft_id=info:doi/10.1186%2F1556-276X-9-604&rft.externalDBID=n%2Fa&rft.externalDocID=oai_biomedcentral_com_1556_276X_9_604 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1556-276X&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1556-276X&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1556-276X&client=summon |