An Improved Algorithm for Satellite-derived UV Radiation

The improved algorithm surface irradiance derived from a range of satellite-based sensors (SIDES) is presented in this article. It calculates various types of surface UV intensities, such as biologically weighted or unweighted UV spectra, integrated doses or irradiance at specific wavelengths, using...

Full description

Saved in:
Bibliographic Details
Published inPhotochemistry and photobiology Vol. 77; no. 1; pp. 52 - 57
Main Authors Wuttke, Sigrid, Verdebout, Jean, Seckmeyer, Gunther
Format Journal Article
LanguageEnglish
Published Lawrence Blackwell Publishing Ltd 01.01.2003
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:The improved algorithm surface irradiance derived from a range of satellite-based sensors (SIDES) is presented in this article. It calculates various types of surface UV intensities, such as biologically weighted or unweighted UV spectra, integrated doses or irradiance at specific wavelengths, using data from satellite instruments. These surface UV data are mainly useful for environmental impact or process studies where high accuracy or a high temporal resolution is required. In contrast to several previous studies, SIDES has been validated with spectral measurements. By this method an averaging of positive or negative deviations over the complete wavelength range is avoided. This is especially important for UV wavelengths around 300 nm where biological effectiveness is highest. The results of SIDES deviate less than 7% from ground-based observations for wavelengths between 295 and 400 nm. In contrast, the corresponding deviations of the joint research center algorithm escalate for shorter wavelengths, reaching 35% at 295 nm. This large deviation is due to an inaccurate interpolation procedure that has been detected by spectral analysis. Thus, spectral validation is demonstrated to be an appropriate tool to detect weaknesses in such an algorithm and provides information essential for improvement.
ISSN:0031-8655
1751-1097
DOI:10.1562/0031-8655(2003)077<0052:AIAFSD>2.0.CO;2