Optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope

• Main Author: Behan, Gavin Joseph
• Format: Dissertation
• Language: English
• Published: University of Oxford 2009
• Subjects: aberration-corrected; Materials Sciences; optical sectioning; scanning confocal electron microscopy; scanning transmission electron microscopy

This thesis concerns the experimental application of the technique of optical sectioning in the aberration-corrected scanning transmission electron microscope (STEM). Another aim was to perform optical sectioning experiments on the still relatively new scanning confocal electron microscope (SCEM). To test the feasibility of this technique, experiments were performed on a variety of samples to measure the achievable depth response. Deconvolution methods were explored in an attempt to further improve the depth response. Finally, some of the first optical sectioning experiments were performed in the SCEM using both elastic and inelastically scattered electrons. The results showed a clear need to investigate confocal electron microscopy due to the missing cone problem for incoherent imaging in the STEM. This is particularly evident when imaging objects of greater width than the STEM probe. Confocal electron microscopy using inelastic electrons appeared to be a promising imaging mode for the future with this thesis consisting of early work in the field.