Run-time consistency checking in discrete simulation models

• Published in: European Design and Test Conference: Proceedings of the 1995 European conference on Design and Test; 06-09 Mar. 1995 p. 223
• Main Authors: Fleurkens, J. W. G., van Eijk, C. A. J., Jess, J. A. G.
• Format: Conference Proceeding
• Language: English
• Published: Washington, DC, USA IEEE Computer Society 06.03.1995
• Series: ACM Conferences
• Subjects: event traces; discrete event monitors; erroneous behaviour; IC design; circuit analysis computing; run-time consistency checking; discrete event simulator; design productivity; discrete simulation models; specification methods; integrated circuit design; specification languages; circuit CAD; discrete event simulation; specification language
• ISBN: 0818670398; 9780818670398
• DOI: 10.5555/787258.787443

A new and efficient method is presented to improve the validation capabilities of a discrete event simulator. Discrete event monitors are introduced as a means to analyse event traces during a simulation run. This facilitates the defection and location of erroneous behaviour in a design specification. Furthermore, a specification language for discrete event monitors is described and it is shown how this language facilitates the integration of other specification methods. Experimental results are presented to demonstrate the efficiency of the proposed techniques.